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IEC 60134:1961

Current
Current

The latest, up-to-date edition.

Rating systems for electronic tubes and valves and analogous semiconductor devices
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

01-01-1961

Describes rating systems in use for electronic tubes and analogous semiconductor devices. Its object is to bring about a greater understanding of these systems, especially in the division of responsibility between the manufacturer and the circuit designer.

Committee
TC 110
DevelopmentNote
Stability Date: 2024. (11/2012)
DocumentType
Standard
Pages
9
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
NBN C 86 010 : 1984 Identical
NBN C 83 300 : 1985 Identical
NEN 10134 : 1977 Identical

BS 9026:1970 Rules for the preparation of detail specifications for low noise signal amplifier tubes of assessed quality with integral permanent magnet focusing
BS CECC 13000(1981) : 1981 AMD 7573 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - CAMERA TUBES
BS EN 111000:1993 Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes
BS EN 114000:1993 Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes
BS CECC 12000(1981) : 1981 AMD 9605 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - IMAGE CONVERTER & IMAGE INTENSIFIER TUBES
BS IEC 60748-2.11 : 1999 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR SINGLE SUPPLY INTEGRATED CIRCUIT, ELECTRICALLY ERASABLE, AND PROGRAMMABLE READ-ONLY MEMORY
03/117620 DC : DRAFT NOV 2003 IEC 60747-1 ED.2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES AND INTEGRATED CIRCUITS - PART 1: GENERAL
BS EN 113000:1993 Harmonized system of quality assessment for electronic components. Generic specification: camera tubes
BS QC 790105:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories
BS EN 165000-1:1996 Film and hybrid integrated circuits Generic specification. Capability approval procedure
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
BS IEC 60747-1 : 2006 SEMICONDUCTOR DEVICES - PART 1: GENERAL
I.S. EN 136000:1994 MAGNETRONS (GENERIC SPECIFICATION)
I.S. EN 114000:1994 GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES
DEFSTAN 59-60(PT5)/2(1972) : 1972 VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 5: FORWARD TRAVELLING-WAVE AMPLIFIER TUBES
BS CECC 11000(1980) : 1980 AMD 7600 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - CATHODE RAY TUBES
EN 135000:1992 Generic Specification: Travelling wave amplifier tubes
EN 114000:1991 Generic Specification: Photomultiplier tubes
BS CECC 90000:1991 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS CECC 20000:1983 Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
BS CECC 90000:1985 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
EN 113000:1991 Generic Specification: Camera tubes
BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits Interface integrated circuits
BS 9041:1978 Rules for the preparation of detail specifications for gas filled microwave switching tubes of assessed quality: tunable and broadband TR tubes and TR limiters. Full assessment level
BS CECC14000(1984) : 1984 AMD 7575 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES
BS QC 790111:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories
BS PD IEC 62240 : 2001 USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURER'S SPECIFIED TEMPERATURE RANGES
PD IEC/TR 62240:2005 Process management for avionics. Use of semiconductor devices outside manufacturers\' specified temperature range
I.S. EN 135000:1994 TRAVELLING WAVE AMPLIFIER TUBES (GENERIC SPECIFICATION)
BS CECC14001(1984) : 1984 AMD 7576 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: PHOTOMULTIPLIER TUBES
BS 9054:1971 Rules for the preparation of detail specifications for radar display cathode ray tubes of assessed quality
BS CECC 45000:1977 Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes
BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
IEC 60748-2-12:2001 Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)
BS CECC 63000:1990 Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
BS CECC 50000:1987 Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
BS 9061:1971 Rules for the preparation of detail specifications for vidicon tubes of assessed quality electromagnetic focusing and scanning
DEFSTAN 59-60(PT3)/2(1977) : 1977 VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 3: COUNTER, SELECTOR, AND INDICATOR TUBES
BS CECC 13001(1981 : 1981 AMD 7574 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - CAMERA TUBES
BS EN 113001:1997 Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes
BS IEC 60748-23-1:2002 Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification
NF EN 112000 : 2014 GENERIC SPECIFICATION: IMAGE CONVERTER AND IMAGE INTENSIFIER TUBES
BS EN 120000:1996 Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
BS IEC 60748-2.12 : 2001 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR PROGRAMMABLE LOGIC DEVICES (PLDS)
BS 9031:1971 Rules for the preparation of detail specifications for pulsed fixed-frequency magnetrons of assessed quality
I.S. 604:1984 COLD CATHODE INDICATOR TUBES (GENERIC SPECIFICATION)
BS 9018:1973 Rules for the preparation of detail specifications for pulse modulator hydrogen thyratrons of assessed quality
BS 9027:1971 Rules for the preparation of detail specifications for forward travelling-wave power tubes of assessed quality
BS 9064:1983 Sectional specification for circulators or isolators of assessed quality for capability approval
BS 9300:1969 Specification for semiconductor devices of assessed quality: generic data and methods of test
IEC TR 62240-1:2013 Process management for avionics - Electronic components capability in operation - Part 1: Temperature uprating
IEC 60748-23-1:2002 Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification
IEC TR 62240:2005 Process management for avionics - Use of semiconductor devices outside manufacturers' specified temperature range
I.S. EN 113000:1994 GENERIC SPECIFICATION: CAMERA TUBES
IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
BS CECC36000(1978) : 1978 AMD 7581 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: MAGNETRONS
BS 9014:1974 Specification for pulse modulator hydrogen thyratron tubes of assessed quality: generic data and methods of test
BS EN 112000:1997 Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes
DIN IEC 60747-1:1987-03 SEMICONDUCTOR DEVICES; DISCRETE DEVICES AND INTEGRATED CIRCUITS; GENERAL
BS EN 111001:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes
BS CECC35000(1978) : 1978 AMD 7881 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. GENERIC SPECIFICATION: TRAVELLING WAVE AMPLIFIER TUBES
BS 9032:1975 Rules for the preparation of detail specifications for pulsed magnetrons (excluding frequency-agile magnetrons) of assessed quality. Basic assessment level
GEIA 4900 : 2001 USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURERS' SPECIFIED TEMPERATURE RANGES
BS CECC11001(1980) : 1980 AMD 9098 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: CATHODE RAY TUBES
BS 9040:1978 Specification for gas-filled microwave switching tubes of assessed quality: generic data and methods of test
BS EN 112001:1997 Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes
BS 9044:1971 Rules for the preparation of detail specifications for gas-filled microwave switching tubes of assessed quality: passive protection tubes
DEFSTAN 59-60(PT5)SECE/1(1972) : 1972 VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 5: FORWARD TRAVELLING-WAVE AMPLIFIER TUBES - SECTION E: DETAIL SPECIFICATIONS
I.S. EN 165000-1:1998 FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION CAPABILITY APPROVAL PROCEDURE
I.S. EN 111000:1994 GENERIC SPECIFICATION: CATHODE RAY TUBES
IEC PAS 62240:2001 Use of semiconductor devices outside manufacturers' specified temperature range
EN 136000:1992 Generic Specification: Magnetrons
BS CECC11101(1984) : 1984 AMD 9097 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: DISPLAY STORAGE TUBES
BS 9052:1970 Rules for the preparation of detail specifications for general purpose professional instrument cathode ray tubes of assessed quality
BS EN 111101:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes
PD IEC/TR 62240-1:2013 Process management for avionics. Electronic components capability in operation Temperature uprating
BS 9043:1977 Rules for the preparation of detail specifications for gas filled microwave switching tubes of assessed quality: pre-TR tubes. Full assessment level
BS EN 114001:1997 Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes
DIN EN 190000:1996-05 GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS
BS EN 190000:1996 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
04/30122195 DC : DRAFT SEP 2004 IEC 60747-1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES AND INTEGRATED CIRCUITS - PART 1: GENERAL
BS 9053:1973 Rules for the preparation of detail specifications for electrical charge storage display cathode ray tubes of assessed quality
BS EN 136002:1996 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications
BS CECC12001(1980) : 1980 AMD 7572 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: IMAGE CONVERTER AND IMAGE INTENSIFIER TUBES
EN 111000 : 1991 Generic Specification: Cathode ray tubes
EN 165000-1:1996 Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure
EN 190000:1995 Generic Specification: Monolithic integrated circuits
EN 112000:1992 Generic Specification: Image converter and image intensifier tubes

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