IEC 60512-6-2:2002
Current
Current
The latest, up-to-date edition.
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French, Spanish, Castilian
Published date
21-02-2002
Publisher
Foreword
1 General
2 Preparation of the specimen
3 Test method
4 Measurements
5 Details to be specified
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