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IEC 60653:1979

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

General considerations on ultrasonic cleaning
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

01-09-2001

Language(s)

English - French

Published date

01-01-1979

NO CONTENTS AVAILABLE

Contains an 'experimental' standard defining an ultrasonic cleaning exposure test designed to determine the ability of components and equipment to withstand the effects of ultrasonic cleaning. Has the status of a technical report.

DocumentType
Standard
Pages
13
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
DIN IEC 60068 Beiblatt 10:1985-08 Identical
NEN NPR 10653 : 1980 Identical
UNE 20653:1982 Identical
CEI 50-9 : 1997 Identical
DIN IEC 60068 Beiblatt 10:1985-08 Corresponds

BS EN 60068-2-45:1993 Environmental testing. Test methods Environmental testing. Tests. Test XA and guidance. Immersion in cleaning solvents
BS EN 60749:1999 Semiconductor devices. Mechanical and climatic test methods
BS CECC 90000:1991 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
NF EN 60068 2-45 : 1993 AMD 1 1994 ENVIRONMENTAL TESTING - PART 2: TESTS - TEST XA AND GUIDANCE: IMMERSION IN CLEANING SOLVENTS
CEI EN 60068-2-45 : 2001 BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST XA AND GUIDANCE: IMMERSION IN CLEANING SOLVENTS
EN 60749 : 99 AMD 2 2001 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS

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£18.76
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