IEC 60749-17:2019
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
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English - French
28-03-2019
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
- updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
- addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
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