IEC 60749-4:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French, English
Published date
03-03-2017
Publisher
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 HAST test - General remarks
5 Test apparatus
6 Test conditions
7 Procedure
8 Failure criteria
9 Safety
10 Summary
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