FOREWORD
1 Scope
2 Normative references
3 General description
   3.1 Terms and abbreviations
4 Apparatus
   4.1 Source
        4.1.1 Tuneable laser, Method A
        4.1.2 Broad band source (BBS), Method B
   4.2 Polarisation controller
   4.3 Device under test (DUT)
        4.3.1 Device input optics
        4.3.2 Device output optics
   4.4 Receiver system
        4.4.1 Broad band detectors (D1,D2), Method A
        4.4.2 Tuneable receiver, Method B
   4.5 Temporary joints (TJ)
5 Procedure
   5.1 Preparation of specimens
   5.2 System initialisation
   5.3 System reference measurement
        5.3.1 Measurement of the reference spectra for method A
        5.3.2 Measurement of reference spectra for method B
   5.4 Measurement of device spectra
6 Characterisation of the device under test
   6.1 Determination of transfer functions
        6.1.1 Accounting for the source variations
        6.1.2 Calculations for the Mueller matrix method
   6.2 Calculation of attenuation (A)
   6.3 Transmission [T[lambda]] spectra measurements
        6.3.1 Peak power calculation
        6.3.2 Normalisation of the transfer function
        6.3.3 Bandwidth and full spectral width
        6.3.4 Centre wavelength
        6.3.5 Isolation
   6.4 Polarisation dependent losses (PDL[lambda])
7 Details to be specified
   7.1 Tuning sub-system
   7.2 Power detector
   7.3 DUT
Annex A Reflection spectrum measurements
Annex B Determination of the wavelength increment parameter
Annex C Determination of a mean value using the shorth function
Annex D Precautions using IEC 61300-3-5 and 61300-3-7