IEC PAS 62171:2000

SECTION I
1 SPECIFIC TEST REQUIREMENTS
2 ACCEPTANCE CONDITIONS
   2.1 MIL-M-38510 Requirements for In-Line Screening
        of Class S Devices
   2.2 Manufacturer and Customer Required Test
   2.3 Quality Assurance Requirements (MIL-M-38510,
        Paragraph 3.4)
   2.4 Qualification and Manufacturer-Imposed Test and
        (MIL-H-38510 and MIL-H-38534, Paragraph 4.3.7 and
        Section B of MIL-STD-1772)
SECTION II
1 SOURCES OF PARTICLES
   1.1 Material/Handling
   1.2 Processing
   1.3 Environment
   1.4 Danger of Particles
   1.5 Process Control
SECTION III
1 PIND TEST SYSTEM
   1.1 Testing Principles and Philosophy
2 SYSTEMS AND COMPONENTS
   2.1 Control Unit
   2.2 Threshold Detector
   2.3 Shaker
   2.4 Transducer
   2.5 Monitor Oscilloscope
   2.6 Cabling Requirements
   2.7 Sensitivity Test Unit (STU)
   2.8 Visual Displacement Wedge
   2.9 Mounting Medium
3 CALIBRATION AND EQUIPMENT VERIFICATION
   3.1 Calibration Requirements
   3.2 Detailed Calibration Steps
   3.3 Calibration Intervals
   3.4 Control Sample Verification
4 THRESHOLD VOLTAGE WINDOW LEVELS
   4.1 Low Threshold Requirements
   4.2 Functional Threshold Calibration Technique
5 TRANSMISSION OF ACOUSTIC SIGNALS
6 COMPARISON OF ATTACHMENT MEDIUMS
7 SENSITIVITY TEST UNIT
8 EQUIPMENT PREVENTIVE MAINTENANCE
9 REASONS FOR MAINTENANCE AND SYMPTOMS OF MISUSE
10 TEST INTERFERENCE
   10.1 External
   10.2 Internal
SECTION IV
1 OPERATOR EDUCATION AND TRAINING
   1.1 Introduction
   1.2 Particle Impact Noise Detection Test Training
   1.3 Materials and Equipment Needed
   1.4 Procedure
   1.5 Certification and Training Records (Classroom)
   1.6 Explanation of PIND Test Operator Procedure
        (at equipment site)
   1.7 Process Control Verification
   1.8 On the Job Training
   1.9 Certification
SECTION V
1 LOOSE PARTICLE RECOVERY AND FAILURE ANALYSIS
SECTION VI
1 SUMMARY
REFERENCES