Hardmetals — Determination of silicon in cobalt metal powders — Photometric method

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, Russian

Published date

19-05-2008

Publisher

International Organization for Standardization

ISO 11877:2008 specifies a photometric method to be used for the determination of the mass fraction of silicon in the range of 20 µg/g to 300 µg/g in cobalt metal powders.

DevelopmentNote	Supersedes ISO/DIS 11877. (05/2008)
DocumentType	Standard
Pages	4
PublisherName	International Organization for Standardization
Status	Current

Standards	Relationship
NEN ISO 11877 : 2008	Identical
SS-ISO 11877:2010	Identical
BS ISO 11877:2008	Identical

ISO 5725-1:1994	Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
ISO 5725-3:1994	Accuracy (trueness and precision) of measurement methods and results — Part 3: Intermediate measures of the precision of a standard measurement method
ISO 5725-6:1994	Accuracy (trueness and precision) of measurement methods and results — Part 6: Use in practice of accuracy values
ISO 5725-4:1994	Accuracy (trueness and precision) of measurement methods and results Part 4: Basic methods for the determination of the trueness of a standard measurement method
ISO 5725-2:1994	Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
ISO 5725-5:1998	Accuracy (trueness and precision) of measurement methods and results — Part 5: Alternative methods for the determination of the precision of a standard measurement method