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ISO
ISO 15932:2013

ISO 15932:2013

Current

Current

The latest, up-to-date edition.

Microbeam analysis — Analytical electron microscopy — Vocabulary

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, French

Published date

13-12-2013

Publisher

International Organization for Standardization

ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

Committee
ISO/TC 202/SC 1
DevelopmentNote
Supersedes ISO/DIS 15932. (12/2013)
DocumentType
Standard
Pages
21
PublisherName
International Organization for Standardization
Status
Current

Standards Relationship
BS ISO 15932:2013 Identical
NF ISO 15932 : 2014 Identical

BS ISO 25498:2010 Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
ISO 20263:2017 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
17/30343628 DC : 0 BS ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE
16/30319120 DC : 0 BS ISO 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS
BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
ISO 25498:2018 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope

ISO 1087-1:2000 Terminology work Vocabulary Part 1: Theory and application
ISO 22493:2014 Microbeam analysis Scanning electron microscopy Vocabulary
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 704:2009 Terminology work — Principles and methods

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
Hardcopy - French
PDF - French
PDF 3 Users - French
PDF 5 Users - French
PDF 9 Users - French
Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
Hardcopy - French
PDF - French
PDF 3 Users - French
PDF 5 Users - French
PDF 9 Users - French
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