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ISO 20289:2018

Current
Current

The latest, up-to-date edition.

Surface chemical analysis — Total reflection X-ray fluorescence analysis of water
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

15-03-2018

ISO 20289:2018 provides a chemical method for technicians working with Total Reflection X-ray Fluorescence (TXRF) instrumentation to perform measurements of water samples, according to good practices, with a defined degree of accuracy and precision. Target users are identified among laboratories performing routine analysis of large numbers of samples, which also comply with ISO/IEC 17025.

ISO 20289:2018 specifies a method to determine the content of elements dissolved in water (for example, drinking water, surface water and ground water). Taking into account the specific and additionally occurring interferences, elements can also be determined in waste waters and eluates. Sampling, dilution and pre-concentration methods are not included in this document.

Elements that can be determined with the present method may change according to the X-ray source of the instrument. No health, safety or commercial aspects are considered herewith.

The working range depends on the matrix and the interferences encountered. In drinking water and relatively unpolluted waters, the limit of quantification lies between 0,001 mg/l and 0,01 mg/l for most of the elements. The working range typically covers concentrations between 0,001 mg/l and 10 mg/l, depending on the element and predefined requirements.

Annex B reports, for example, the complete validation of the method of TXRF analysis of water performed with instrumentation that has Mo as the X-ray source and uses Ga as the internal standard for calibration.

Quantification limits of most elements are affected by blank contamination and depend predominantly on the laboratory air-handling facilities available, on the purity of reagents and the cleanliness of labware.

Committee
ISO/TC 201/SC 10
DevelopmentNote
Supersedes ISO/DIS 20289. (03/2018)
DocumentType
Standard
Pages
19
ProductNote
THIS STANDARD ALSO REFERS TO JCGM 100 series,
PublisherName
International Organization for Standardization
Status
Current

Standards Relationship
JIS K 0181:2021 Identical

ISO 5725-1:1994 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
ISO 17331:2004 Surface chemical analysis Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 14706:2014 Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 5667-3:2012 Water quality Sampling Part 3: Preservation and handling of water samples
ISO 5667-1:2006 Water quality Sampling Part 1: Guidance on the design of sampling programmes and sampling techniques
ISO 5725-2:1994 Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
ISO 3696:1987 Water for analytical laboratory use — Specification and test methods
ISO/TS 18507:2015 Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis

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