ISO 21068-1:2008
Current
Current
The latest, up-to-date edition.
Chemical analysis of silicon-carbide-containing raw materials and refractory products Part 1: General information and sample preparation
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English, French
Published date
21-07-2008
ISO 21068-1:2008 gives definitions and specifies techniques for the preparation of samples for the chemical analysis of silicon-carbide-containing raw materials and refractory products.
| DevelopmentNote |
Supersedes ISO/DIS 21068-1. (07/2008)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| NBN EN ISO 21068-1 : 2008 | Identical |
| NEN EN ISO 21068-1 : 2008 | Identical |
| NS EN ISO 21068-1 : 1ED 2008 | Identical |
| I.S. EN ISO 21068-1:2008 | Identical |
| PN EN ISO 21068-1 : 2010 | Identical |
| SN EN ISO 21068-1:2008 | Identical |
| UNI EN ISO 21068-1 : 2008 | Identical |
| SS-EN ISO 21068-1 : 2008 | Identical |
| UNE-EN ISO 21068-1:2008 | Identical |
| BS EN ISO 21068-1:2008 | Identical |
| EN ISO 21068-1:2008 | Identical |
| NF EN ISO 21068-1 : 2008 | Identical |
| DIN EN ISO 21068-1:2008-12 | Identical |
| UNI EN ISO 1927-3 : 2013 | MONOLITHIC (UNSHAPED) REFRACTORY PRODUCTS - PART 3: CHARACTERIZATION AS RECEIVED |
| DIN EN 15991:2016-02 | TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV) |
| DIN EN ISO 21068-2:2008-12 | CHEMICAL ANALYSIS OF SILICON-CARBIDE-CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 2: DETERMINATION OF LOSS ON IGNITION, TOTAL CARBON, FREE CARBON AND SILICON CARBIDE, TOTAL AND FREE SILICA AND TOTAL AND FREE SILICON |
| BS EN ISO 1927-3:2012 | Monolithic (unshaped) refractory products Characterization as received |
| BS EN 15991:2015 | Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) |
| BS EN 15979:2011 | Testing of ceramic raw and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation |
| DIN EN ISO 21068-3:2008-12 | CHEMICAL ANALYSIS OF SILICON-CARBIDE-CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 3: DETERMINATION OF NITROGEN, OXYGEN AND METALLIC AND OXIDIC CONSTITUENTS |
| 06/30159547 DC : 0 | BS EN ISO 21068-2 - CHEMICAL ANALYSIS OF SILICON CARBIDE CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 2: DETERMINATION OF LOSS ON IGNITION, TOTAL CARBON, FREE CARBON AND SILICON CARBIDE, TOTAL AND FREE SILICA AND TOTAL AND FREE SILICON |
| I.S. EN ISO 21068-2:2008 | CHEMICAL ANALYSIS OF SILICON-CARBIDE-CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 2: DETERMINATION OF LOSS ON IGNITION, TOTAL CARBON, FREE CARBON AND SILICON CARBIDE, TOTAL AND FREE SILICA AND TOTAL AND FREE SILICON |
| BS EN ISO 12677:2011 | Chemical analysis of refractory products by X-ray fluorescence (XRF) Fused cast-bead method |
| 06/30159551 DC : 0 | BS EN ISO 21068-3 - CHEMICAL ANALYSIS OF SILICON CARBIDE CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 3; DETERMINATION OF NITROGEN, OXYGEN AND METALLIC AND OXIDIC CONSTITUENTS |
| BS EN ISO 21068-3:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products Determination of nitrogen, oxygen and metallic and oxidic constituents |
| 13/30261093 DC : 0 | BS ISO 17942 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - METHODS FOR CHEMICAL ANALYSIS OF BORON NITRIDE POWDERS |
| UNI EN ISO 21068-3 : 2008 | CHEMICAL ANALYSIS OF SILICON-CARBIDE CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 3: DETERMINATION OF NITROGEN, OXYGEN AND METALLIC AND OXIDIC CONSTITUENTS |
| BS ISO 17942:2014 | Fine ceramics (advanced ceramics, advanced technical ceramics). Methods for chemical analysis of boron nitride powders |
| DIN EN ISO 1927-3:2013-03 | MONOLITHIC (UNSHAPED) REFRACTORY MATERIALS - PART 3: CHARACTERIZATION AS RECEIVED (ISO 1927-3:2012) |
| UNI EN 15979 : 2011 | TESTING OF CERAMIC RAW AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY OES BY DC ARC EXCITATION |
| UNI EN ISO 21068-2 : 2008 | CHEMICAL ANALYSIS OF SILICON-CARBIDE- CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 2: DETERMINATION OF LOSS ON IGNITION, TOTAL CARBON, FREE CARBON AND SILICON CARBIDE, TOTAL AND FREE SILICA AND TOTAL AND FREE SILICON |
| ISO 17942:2014 | Fine ceramics (advanced ceramics, advanced technical ceramics) Methods for chemical analysis of boron nitride powders |
| UNE-EN ISO 12677:2012 | Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011) |
| EN ISO 1927-3:2012 | Monolithic (unshaped) refractory products - Part 3: Characterization as received (ISO 1927-3:2012) |
| UNI EN ISO 12677 : 2011 | CHEMICAL ANALYSIS OF REFRACTORY PRODUCTS BY X-RAY FLUORESCENCE (XRF) - FUSED CAST-BEAD METHOD |
| 13/30261099 DC : 0 | BS ISO 17947 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - METHODS FOR CHEMICAL ANALYSIS OF FINE SILICON NITRIDE POWDERS |
| 14/30283939 DC : 0 | BS EN 15991 - TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV) |
| 09/30195571 DC : 0 | BS EN ISO 12677 - CHEMICAL ANALYSIS OF REFRACTORY PRODUCTS BY X-RAY FLUORESCENCE (XRF) - FUSED CAST-BEAD METHOD |
| I.S. EN 15979:2011 | TESTING OF CERAMIC RAW AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY OES BY DC ARC EXCITATION |
| 17/30327875 DC : DRAFT JAN 2017 | BS ISO 16169 - PREPARATION OF SILICON CARBIDE AND SIMILAR MATERIALS FOR ANALYSIS BY ISO 12677 X-RAY FLUORESCENCE (XRF) - FUSED CAST-BEAD METHOD |
| PREN 15991 : DRAFT 2014 | TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV) |
| I.S. EN ISO 21068-3:2008 | CHEMICAL ANALYSIS OF SILICON-CARBIDE-CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 3: DETERMINATION OF NITROGEN, OXYGEN AND METALLIC AND OXIDIC CONSTITUENTS |
| DIN EN ISO 12677:2013-02 | Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011) |
| ISO 12677:2011 | Chemical analysis of refractory products by X-ray fluorescence (XRF) Fused cast-bead method |
| ISO 1927-3:2012 | Monolithic (unshaped) refractory products — Part 3: Characterization as received |
| ISO 21068-3:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products Part 3: Determination of nitrogen, oxygen and metallic and oxidic constituents |
| ISO 21068-2:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products Part 2: Determination of loss on ignition, total carbon, free carbon and silicon carbide, total and free silica and total and free silicon |
| EN ISO 21068-2:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 2: Determination of loss on ignition, total carbon, free carbon and silicon carbide, total and free silica and total and free silicon (ISO 21068-2:2008) |
| EN ISO 12677:2011 | Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011) |
| EN ISO 21068-3:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 3: Determination of nitrogen, oxygen and metallic and oxidic constituents (ISO 21068-3:2008) |
| EN 15979:2011 | Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation |
| EN 15991:2015 | Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) |
| DIN EN 15979:2011-04 | Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation |
| BS EN ISO 21068-2:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products Determination of loss on ignition, total carbon, free carbon and silicon carbide, total and free silica and total and free silicon |
| I.S. EN ISO 1927-3:2012 | MONOLITHIC (UNSHAPED) REFRACTORY PRODUCTS - PART 3: CHARACTERIZATION AS RECEIVED (ISO 1927-3:2012) |
| I.S. EN 15991:2015 | TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV) |
| ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
| ISO 10081-1:2003 | Classification of dense shaped refractory products Part 1: Alumina-silica |
| ISO 21587-1:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 1: Apparatus, reagents, dissolution and gravimetric silica |
| ISO 21079-3:2008 | Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP -AES) |
| ISO 21587-3:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 3: Inductively coupled plasma and atomic absorption spectrometry methods |
| ISO 5022:1979 | Shaped refractory products Sampling and acceptance testing |
| ISO 12677:2011 | Chemical analysis of refractory products by X-ray fluorescence (XRF) Fused cast-bead method |
| EN 12698-1:2007 | Chemical analysis of nitride bonded silicon carbide refractories - Part 1: Chemical methods |
| ISO 9286:1997 | Abrasive grains and crude Chemical analysis of silicon carbide |
| ISO 21079-2:2008 | Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 2: Wet chemical analysis |
| ISO 11648-2:2001 | Statistical aspects of sampling from bulk materials — Part 2: Sampling of particulate materials |
| ISO 21587-2:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 2: Wet chemical analysis |
| ISO 10081-4:2014 | Classification of dense shaped refractory products Part 4: Special products |
| ISO 31-0:1992 | Quantities and units Part 0: General principles |
| ISO 10081-3:2003 | Classification of dense shaped refractory products Part 3: Basic products containing from 7 % to 50 % residual carbon |
| ISO 1927:1984 | Prepared unshaped refractory materials (dense and insulating) Classification |
| ISO 10060:1993 | Dense, shaped refractory products Test methods for products containing carbon |
| ISO 21068-2:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products Part 2: Determination of loss on ignition, total carbon, free carbon and silicon carbide, total and free silica and total and free silicon |
| EN 1094-4:1995 | Insulating refractory products - Part 4: Determination of bulk density and true porosity |
| EN 12698-2:2007 | Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods |
| ISO 10081-2:2003 | Classification of dense shaped refractory products Part 2: Basic products containing less than 7 % residual carbon |
| ISO 26845:2008 | Chemical analysis of refractories General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods |
| ISO 8656-1:1988 | Refractory products Sampling of raw materials and unshaped products Part 1: Sampling scheme |
| ISO 21079-1:2008 | Chemical analysis of refractories containing alumina, zirconia and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 1: Apparatus, reagents and dissolution |
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Hardcopy - English
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Hardcopy - French
PDF - French
PDF 3 Users - French
PDF 5 Users - French
PDF 9 Users - French
Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
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Hardcopy - French
PDF - French
PDF 3 Users - French
PDF 5 Users - French
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