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MIL
MIL-HDBK-816 Base Document:1994

MIL-HDBK-816 Base Document:1994

Current

Current

The latest, up-to-date edition.

Guidelines for Developing Radiation Hardness Assurance Device Specifications

Amended by

MIL-HDBK-816 Notice 3 - Validation:2018

Available format(s)

PDF

Published date

09-12-1994

Publisher

US Military Specs/Standards/Handbooks

Provides guidelines and easy to follow procedures for the preparation of detailed device specifications for the procurement of microcircuits and semiconductor devices where radiation Hardness Assurance is required.

The primary objective of this document is to provide guidelines and easy to follow procedures for the preparation of detailed device specifications for the procurement of microcircuits and semiconductor devices where radiation Hardness Assurance (RHA) is required. The guidelines are applicable to MIL-M-38510, MIL-PRF-38534, MIL-PRF-38535, and MIL-PRF-19500 microcircuit and semiconductor device detailed specifications, Standard Microcircuit Drawings (SMDs) as well as other contractor prepared specifications such as Source Control Drawings (SOCD), Selected Item Drawings (SID), and Specification Control Drawings (SCD). Recommended procedures are provided for characterizing the radiation response of a part and for obtaining post-irradiation post-irradiation end-point limits for qualification and Lot Acceptance Tests (LAT).

DevelopmentNote
CHANGE 1 - Notice of Change. (04/2002) NOTICE 1 - Notice of Validation. (04/2007) NOTICE 3 - Notice of Validation. (03/2018)
DocumentType
Standard
Pages
107
ProductNote
NEW CHILD NOT 3 2018 IS NOW ADDED
PublisherName
US Military Specs/Standards/Handbooks
Status
Current

MIL-HDBK-817 Base Document:1994 SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE
MIL-HDBK-814 Base Document:1994 IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES
MIL-HDBK-815 Base Document:1994 DOSE-RATE HARDNESS ASSURANCE GUIDELINES

MIL-HDBK-814 Base Document:1994 IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES
MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-HDBK-279 Base Document:1985 TOTAL DOSE HARDNESS ASSURANCE GUIDELINE FOR SEMICONDUCTOR DEVICE & MICROCIRCUIT
MIL-M-38510 Revision J:1991 MICROCIRCUITS, SPECIFICATION FOR
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-HDBK-339 Base Document:1984 CUSTOM LARGE SCALE INTEGRATED CIRCUIT DEVELOPMENT & ACQUISITION FOR SPACE VEHICLES
MIL-HDBK-280 Base Document:1985 NEUTRON HARDNESS ASSURANCE GUIDELINES FOR SEMICONDUCTOR DEVICES AND MICROCIRCUITS

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