Transistor, NPN, Silicon, Low-Power, Device Types 2N3019, 2N3057A, and 2N3700,Encapsulated (Through-Hole and Surface Mount)and Unencapsulated, Radiation Hardness Assurance, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC,and JANKC

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26-06-2015

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US Military Specs/Standards/Handbooks

1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES

Specifies the performance requirements for NPN, silicon, low-power transistors.

This specification covers the performance requirements for NPN, silicon, low-power transistors. Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device type. Provisions for radiation hardness assurance (RHA) to eleven radiation levels are provided for quality levels JANTXV, JANS, JANHC, and JANKC. RHA level designators \"E\", \"K\", \"U\", \"M\", \"D\", \"P\", \"L\", \"R\", \"F\", \"G\", and \"H\" are appended to the device prefix to identify devices, which have passed RHA requirements.

DevelopmentNote	Supersedes MIL S 19500/391 (C). (02/2000)
DocumentType	Standard
Pages	80
PublisherName	US Military Specs/Standards/Handbooks
Status	Current
Supersedes	MIL S 19500/391 : C (2)

MIL-PRF-19500 Revision P:2010	SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-750 Revision F:2011	TEST METHODS FOR SEMICONDUCTOR DEVICES

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MIL-PRF-19500-391 Revision P:2015

Transistor, NPN, Silicon, Low-Power, Device Types 2N3019, 2N3057A, and 2N3700,Encapsulated (Through-Hole and Surface Mount)and Unencapsulated, Radiation Hardness Assurance, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC,and JANKC

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