MIL-PRF-55310 Revision E:2006
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Current
The latest, up-to-date edition.
OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
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PDF
Publisher
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
APPENDIX A - CLASS 2 OSCILLATOR QPL SYSTEM
REQUIREMENTS
APPENDIX B - COMPONENT EVALUATION SYSTEM
APPENDIX C - PROCEDURE FOR QUALIFICATION
INSPECTION
INDEX
Specifies the general requirements for quartz crystal oscillators used in electronic equipment.
| Committee |
FSC 5955
|
| DevelopmentNote |
Supersedes MIL O 55310 (C). (04/2006)
|
| DocumentType |
Standard
|
| Pages |
328
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
| MIL-PRF-55310-37 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS |
| DSCC 13018 : A | OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 32.768 KHZ TO 160 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT |
| MIL STD 11991 : A | GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES |
| BS IEC 61671-2:2016 | Standard for automatic test markup language (ATML) instrument description |
| MIL-PRF-55310-40 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS |
| I.S. EN 60679-1:2017 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 61671-2:2016 | Standard for automatic test markup language (ATML) instrument description |
| MIL-PRF-55310-33 Revision D:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS |
| MIL-PRF-55310-38 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS |
| MIL-PRF-55310-13 Revision J:2010 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 300 HZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS |
| MIL-PRF-55310-29 Revision C:2011 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.2 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HCMOS |
| MIL-PRF-55310-35 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS |
| MIL-PRF-55310-32 Revision C:2017 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHZ THROUGH 125 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS |
| MIL-PRF-55310-18 Revision F:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 HZ THROUGH 15.0 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS |
| MIL-PRF-55310-8 Revision J:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 HZ THROUGH 50 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| MIL-PRF-55310-39 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS |
| MIL-PRF-55310-14 Revision H:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.1 HZ THROUGH 25 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| MIL-PRF-55310-21 Revision G:2008 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL |
| MIL-PRF-55310-12 Revision H:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.05 MHZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS |
| MIL-PRF-55310-25 Revision D:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 25 MHZ THROUGH 175 MHZ, HERMETIC SEAL, SQUARE WAVE, EMITTER COUPLED LOGIC |
| IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| NASA MSFC STD 3012 : 2012 | ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE |
| MIL-PRF-55310-9 Revision J:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 400 KHZ THROUGH 60 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| MIL-PRF-55310-28 Revision D:2017 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| MIL-PRF-55310-15 Revision G:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 HZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS |
| MIL-PRF-55310-20 Revision F:2012 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 40.0 KHZ THROUGH 60.0 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| MIL-PRF-55310-10 Revision J:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 KHZ THROUGH 60 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| DSCC 05014 : B | OSCILLATOR, CRYSTAL CONTROLLED, 5 VOLT, ENABLE/TRI-STATE, 312 KHZ TO 120 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT |
| MIL-PRF-55310-11 Revision G:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.05 MHZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS |
| MIL-PRF-55310-17 Revision F:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), GATED, 250 KHZ THROUGH 50 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| IEEE 1871.1-2014 | IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters |
| MIL-PRF-55310-26 Revision D:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 10 KHZ THROUGH 65 MHZ, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS |
| MIL-PRF-55310-27 Revision E:2017 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS |
| MIL-PRF-55310-16 Revision K:2017 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.1 HZ THROUGH 80 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| BS EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
| MIL-PRF-55310-30 Revision E:2017 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 450 KHZ THROUGH 100 MHZ, HERMETIC SEAL, LOW VOLTAGE CMOS |
| MIL-PRF-55310-31 Revision A:2010 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHZ THROUGH 200 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS |
| EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| IEEE 1671.2-2012 | IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description |
| DSCC 05013 : B | OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 312 KHZ TO 170 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT |
| MIL-PRF-55310-34 Revision D:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS |
| MIL-PRF-55310-19 Revision E:2009 | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 60.0 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL |
| MIL-PRF-55310-36 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS |
| IPC D 275 : 91 AMD 1 96 | DESIGN STANDARD FOR RIGID PRINTED BOARDS AND RIGID PRINTED BOARD ASSEMBLIES |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-PRF-3098 Revision L:2017 | CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR |
| MIL-STD-810 Revision G:2008 | ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS |
| MIL-PRF-55110 Revision H:2014 | Printed Wiring Board, Rigid, General Specification for |
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-PRF-38534 Revision J:2015 | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL-PRF-31032 Revision C:2016 | Printed Circuit Board/Printed Wiring Board, General Specification for |
| MIL-STD-790 Revision G:2011 | ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
| MIL-STD-1285 Revision D:2004 | MARKING OF ELECTRICAL AND ELECTRONIC PARTS |
| EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
| ASTM A 698/A698M : 2015 : REDLINE | Standard Test Method for Magnetic Shield Efficiency in Attenuating Alternating Magnetic Fields |
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