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MIL-STD-750-4 Base Document:2012

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Diode Electrical Test Methods for Semiconductor Devices Part 4: Test Methods 4000 Through 4999
Available format(s)

PDF

Superseded date

22-06-2020

Language(s)

English

Published date

03-01-2012

FOREWORD
SUMMARY OF CHANGE 2 MODIFICATIONS
1. SCOPE
2. APPLICABLE DOCUMENTS
3. DEFINITIONS
4. GENERAL REQUIREMENTS
5. DETAILED REQUIREMENTS
6. NOTES

Ascertains uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.

Part 4 of this test method standard establishes uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term \"devices\" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts.

DocumentType
Standard
Pages
165
PublisherName
US Military Specs/Standards/Handbooks
Status
Superseded
SupersededBy

MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES

MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES

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