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NEN EN IEC 60749-10 : 2002

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 10: MECHANICAL SHOCK
Published date

12-01-2013

Defines a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.

DevelopmentNote
Supersedes NEN EN IEC 60749. (09/2011)
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current
Supersedes

Standards Relationship
EN 60749-10:2002 Identical
IEC 60749-10:2002 Identical

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