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NEN EN IEC 60749-31 : 2003

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)
Published date

12-01-2013

Applies to semiconductor devices (discrete devices and integrated circuits). It's test objective is to determine the device ignites due to internal heating caused by excessive overloads.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
IEC 60749-31:2002 Identical
EN 60749-31:2003 Identical

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