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NEN EN IEC 60749-4 : 2017

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
Published date

12-01-2013

Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

DevelopmentNote
Supersedes NEN EN IEC 60749. (09/2011)
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current
Supersedes

Standards Relationship
IEC 60749-4:2017 Identical
EN 60749-4:2017 Identical

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