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NEN EN IEC 60749-7 : 2011

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES

Published date

12-01-2013

Defines the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device.

DevelopmentNote
Supersedes NEN EN IEC 60749. (09/2011)
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current
Supersedes

Standards Relationship
IEC 60749-7:2011 Identical
EN 60749-7:2011 Identical

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