NEN-IEC 62373-1:2020
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
Available format(s)
Hardcopy
Language(s)
English - French
Published date
01-08-2020
Publisher
NEN-IEC 62373-1 provides the measurement procedure for a fast BTI (bias temperatureinstability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).
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