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  • NF EN 12698-2 : 2008

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    CHEMICAL ANALYSIS OF NITRIDE BONDED SILICON CARBIDE REFRACTORIES - PART 2: XRD METHODS

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    Published date:  12-01-2013

    Publisher:  Association Francaise de Normalisation

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    Table of Contents - (Show below) - (Hide below)

    Avant-propos
    1 Domaine d'application
    2 Références normatives
    3 Termes et définitions
    4 Appareillage
    5 Échantillonnage
    6 Mode opératoire
      6.1 Préparation des échantillons
      6.2 Paramètres de mesure
      6.3 Analyse qualitative
      6.4 Analyse quantitative
    7 Fidélité
      7.1 Répétabilité
      7.2 Reproductibilité
    8 Rapport d'essai
    Annexe A (normative) Données de diffraction des rayons X
             pour la détermination de la teneur en SiAION-v'
    Bibliographie

    Abstract - (Show below) - (Hide below)

    Specifies methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.

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    Development Note Indice de classement: B49-422-2. (04/2008) Supersedes NF EN 12698. (09/2012)
    Document Type Standard
    Publisher Association Francaise de Normalisation
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    NF EN 12698-1 : 2008 CHEMICAL ANALYSIS OF NITRIDE BONDED SILICON CARBIDE REFRACTORIES - PART 1: CHEMICAL METHODS
    NF EN ISO 21068-1 : 2008 CHEMICAL ANALYSIS OF SILICON CARBIDE- CONTAINING RAW MATERIALS AND REFRACTORY PRODUCTS - PART 1: GENERAL INFORMATION AND SAMPLE PREPARATION
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