SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)

Published date

12-01-2013

Publisher

Association Francaise de Normalisation

Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure

Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.

DevelopmentNote	Indice de classement: C96-022-31. (12/2003) Supersedes NF EN 60749. (06/2007)
DocumentType	Standard
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
DIN EN 60749-31:2003-12	Identical
I.S. EN 60749-31:2003	Identical
EN 60749-31:2003	Identical
IEC 60749-31:2002	Identical
UNE-EN 60749-31:2004	Identical
SN EN 60749-31 : 2003	Identical
BS EN 60749-31:2003	Identical

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NF EN 60749-31 : 2003

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory

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