UNE-EN 60749-43:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (Endorsed by Asociación Española de Normalización in October of 2017.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-10-2017
Publisher
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4471-5
|
| Pages |
46
|
| ProductNote |
THIS STANDARD ALSO REFERS TO JEITA EDR-4704A, JEDEC JEP122, JP001, JEITA EDR-4705,JEDEC JESD 85, JEITA EDR-4708
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
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