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    IEC 60146-1-1 : 4.0

    SEMICONDUCTOR CONVERTERS - GENERAL REQUIREMENTS AND LINE COMMUTATED CONVERTERS - PART 1-1: SPECIFICATION OF BASIC REQUIREMENTS

    International Electrotechnical Committee

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    ASTM D 3004 : 2008 : R2013

    Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials

    American Society for Testing and Materials

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    IEC 60146-1-3 : 3.0

    SEMICONDUCTOR CONVERTORS - GENERAL REQUIREMENTS AND LINE COMMUTATED CONVERTORS - TRANSFORMERS AND REACTORS

    International Electrotechnical Committee

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    IEC TR 60146-1-2 : 2019

    Semiconductor converters – General requirements and line commutated converters – Part 1-2: Application guide

    International Electrotechnical Committee

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    ASTM F 980 : 2016 : REDLINE

    Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

    American Society for Testing and Materials

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    ASTM F 980 : 2016

    Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

    American Society for Testing and Materials

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    ASTM F 76 : 2008 : R2016 : EDT 1

    Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

    American Society for Testing and Materials

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    ASTM F 615M : 1995 : R2013

    Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)

    American Society for Testing and Materials

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    ASTM E 1438 : 2011

    Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

    American Society for Testing and Materials

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