Name: 06/30152634 DC : DRAFT JULY 2006
Brand: BSI

Published date

11-23-2012

Publisher

British Standards Institution

Committee	EPL/47
DocumentType	Draft
PublisherName	British Standards Institution
Status	Current

IEC 61967-2:2005	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
IEC 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 62014-1:2001	Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2)
IEC 61967-5:2003	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
IEC 61967-4:2002+AMD1:2006 CSV	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
IEC 61967-6:2002+AMD1:2008 CSV	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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06/30152634 DC : DRAFT JULY 2006