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09/30183239 DC : 0

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS EN 62572-3 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS - PART 3: LASER MODULES USED FOR TELECOMMUNICATION
Available format(s)

Hardcopy , PDF

Superseded date

03-31-2012

Language(s)

English

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and symbols
  3.1 Terms and definitions
  3.2 Symbols
4 Laser reliability and quality assurance procedure
  4.1 Demonstration of product quality
  4.2 Testing responsibilities
       4.2.1 Recommendation (applicable to laser
             customer/system supplier)
       4.2.2 Recommendation applicable to system operator
  4.3 Quality improvement programmes (QIPs)
5 Tests
  5.1 Structural similarity
  5.2 Burn-in and screening (when applicable in the
       specification)
6 Activities
  6.1 Analysis of reliability results
  6.2 Technical visits to LMMs
  6.3 Design/process changes
  6.4 Deliveries
  6.5 Supplier documentation
Annex A (informative) - Guidance on testing in Table 1
        and Table 2
  A.1 Laser module life tests containing thermoelectric
       coolers (for example, Peltier, Test 1.1, Table 1)
  A.2 Laser module life tests - Uncooled module (Test 1.2,
       Table 1)
  A.3 Laser diode life tests on submounts (Test 1.3,
       Table 1)
  A.4 Monitor photodiode life tests (Test 1.4, Table 1)
  A.5 Temperature cycling and thermal shock (Test 3,
       Table 1 and Test 2, Table
  A.6 Sealing/hermeticity (Test 4, Table 1 and Test 3,
       Table 2)
  A.7 Shock and vibration (Test 5, Table 1 and Test 4,
       Table 2)
  A.8 High-temperature storage (Test 6, Table 1 and Test 5,
       Table 2)
  A.9 Electrostatic discharge sensitivity (ESD) (Test 7,
       Table 1 and Test 6, Table 2)
  A.10 Residual gas analysis (RGA) (Test 8, Table 1 and Test 7,
       Table 2)

BS EN 62572-3

Committee
GEL/86/3
DocumentType
Draft
Pages
21
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC TR 62572-2:2008 Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature

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