13/30278807 DC : 0

Superseded

BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE

Available format(s)

Hardcopy , PDF

Superseded date

12-31-2015

Language(s)

English

Publisher

British Standards Institution

FOREWORD
INTRODUCTION
1.Scope
2.Normative references
3.Configuration of enclosures
4.Designation of types
5.Metal enclosure dimensions
6.Lead connections
7.Designation of metal enclosures
Annex A (informative) - Bibliography

BS EN 61837-3

Committee	EPL/49
DocumentType	Draft
Pages	24
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 61837-3:2015

IEC 60191-6:2009	Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
IEC 60122-3:2010	Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
ISO 1101:2017	Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
IEC 61019-1-2:1993	Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
IEC 60368-1:2000+AMD1:2004 CSV	Piezoelectric filters of assessed quality - Part 1: Genericspecification
IEC 60862-1:2015	Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60368-3:2010	Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
IEC 61240:2016	Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
IEC 60122-2:1983	Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
IEC 60862-2:2012	Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003	Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
IEC 60368-2-2:1996	Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
IEC 60679-3:2012	Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 61178-1:1993	Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification
IEC 60679-2:1981	Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
IEC 60368-2-1:1988	Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
IEC 61019-1-1:1990	Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values
IEC 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification