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14/30310474 DC : 0

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS EN 62433-4 ED 1.0 - EMC IC MODELLING - PART 4: MODELS OF INTEGRATED CIRCUITS FOR RF IMMUNITY BEHAVIOURAL SIMULATION - CONDUCTED IMMUNITY MODELLING (ICIM-CI)
Available format(s)

Hardcopy , PDF

Superseded date

11-30-2016

Language(s)

English

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICIM-CI model description
6 CIML format
7 Extraction
8 Validation of ICIM-CI hypotheses
9 Model usage
Annex A (Informative) - Preliminary definitions for XML
        representation
Annex B (Informative) - DPI example with disturbance load
Annex C (Informative) - Conversions between parameter
        types
Annex D (Informative) - Example of ICIM-CI model in CIML
        format
Annex E (Informative) - CIML Valid keywords and usage
Annex F (Informative) - PDN impedance measurement methods
        using vector network analyzer
Annex G (Informative) - RFIP measurement method description
Annex H (Informative) - Immunity simulation with ICIM model based
                        on non pass/fail test

BS EN 62433-4 Ed 1.0.

Committee
EPL/47
DocumentType
Draft
Pages
85
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices
IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework

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