15/30318551 DC : 0

Superseded

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BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS

Available format(s)

Hardcopy , PDF

Superseded date

12-31-2016

Language(s)

English

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Sampling plan
6 Test methods
7 Identification, labelling, packaging,
   delivery condition
8 Measurement of Curie temperature
9 Measurement of lattice constant (Bond
   method)
10 Measurement of face angle by X-ray
11 Measurement of bulk resistivity
12 Visual inspections
Annex A (normative) - Expression using
        Euler angle description
        for piezoelectric single Crystals
Annex B (informative) - Manufacturing process
        for SAW wafers

BS EN 62276 Ed. 3.0.

Committee	EPL/49
DocumentType	Draft
Pages	39
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 62276:2016

ISO 4287:1997	Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters
IEC 61019-1:2004	Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC 60862-1:2015	Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60758:2016	Synthetic quartz crystal - Specifications and guidelines for use
IEC 61019-2:2005	Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60862-2:2012	Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003	Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
IEC 61019-3:1991	Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections