16/30319120 DC : 0

Superseded

BS ISO 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS

Available format(s)

Hardcopy , PDF

Superseded date

01-31-2018

Language(s)

English

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Abbreviations
4 Terms and definitions
5 Specimen preparation for cross-sectional imaging
6 Determination of an interface position
7 Detailed Procedure for determining the
  position of the Interface
8 Uncertainty of measurement result
9 Error accumulating from each step of the procedure
Annex A (informative) - Examples of processing to
        the real TEM/STEM image of the three image type
Annex B (informative) - Two main applications for this method
Annex C (informative) - Calibration of scale unit:
        pixel size calibration

BS ISO 20263.

Committee	CII/9
DocumentType	Draft
Pages	44
PublisherName	British Standards Institution
Status	Superseded

ISO 22493:2014	Microbeam analysis Scanning electron microscopy Vocabulary
ISO 29301:2010	Microbeam analysis Analytical transmission electron microscopy Methods for calibrating image magnification by using reference materials having periodic structures
ISO 15932:2013	Microbeam analysis — Analytical electron microscopy — Vocabulary
ISO/IEC Guide 98-3:2008	Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)