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17/30343628 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE

Available format(s)

Hardcopy , PDF

Superseded date

03-31-2018

Language(s)

English

Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Principle
5 Equipment
6 Specimens
7 Reference materials
8 Experimental procedure
9 Measurement and solution of the SAED patterns
10 The 180 degrees ambiguity
11 Uncertainty estimation
Annex A (informative) - Interplanar spacing of pure
        Au and Al
Annex B (informative) - Spot diffraction patterns of
        single crystals with body-centred cubic (BCC,
        face-centred cubic (FCC) and hexagonal close
        packed (HCP) structure
Bibliography

BS ISO 25498.

Committee
CII/9
DocumentType
Draft
Pages
38
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 15932:2013 Microbeam analysis — Analytical electron microscopy — Vocabulary

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US$23.96
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