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NA

Status of Standard is Unknown

BS EN 60747-9 - SEMICONDUCTOR DEVICES - PART 9: DISCRETE DEVICES - INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS)
Available format(s)

Hardcopy , PDF

Language(s)

English

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols
5 Essential ratings and characteristics
6 Measuring methods
7 Acceptance and reliability
Annex A (normative) - Measuring method for collector-emitter
        breakdown voltage
Annex B (normative) - Measuring method for collector-emitter
        sustaining voltage
Annex C (normative) - Measuring method for inductive
        load turn-off current under specified conditions
Annex D (normative) - Forward biased safe operating
        area (FBSOA)
Bibliography

BS EN 60747-9.

Committee
EPL/47
DocumentType
Draft
Pages
76
PublisherName
British Standards Institution
Status
NA

IEC 60747-7:2010 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes

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