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ASTM B 748 : 1990 : R2016

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

Available format(s)

Hardcopy , PDF

Superseded date

11-11-2021

Language(s)

English

Published date

11-18-2016

CONTAINED IN VOL. 02.05, 2017 Defines the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microscope (SEM).

1.1This test method covers the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microsope (SEM).

1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee
B 08
DevelopmentNote
Supersedes EIA 364-48 (08/2006)
DocumentType
Test Method
Pages
4
ProductNote
Reconfirmed 2016
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

ASTM B 984 : 2012 : R2020 : EDT 1 Standard Specification for Electrodeposited Coatings of Palladium-Cobalt Alloy for Engineering Use
ASTM B 633 : 2019 Standard Specification for Electrodeposited Coatings of Zinc on Iron and Steel
ASTM B 488 : 2018 Standard Specification for Electrodeposited Coatings of Gold for Engineering Uses
ASTM B 530 : 2009 : R2021 Standard Test Method for Measurement of Coating Thicknesses by the Magnetic Method: Electrodeposited Nickel Coatings on Magnetic and Nonmagnetic Substrates

ASTM E 766 : 1998 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

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US$66.00
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