ASTM F 980 : 2016 : REDLINE
Current
Current
The latest, up-to-date edition.
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Available format(s)
PDF
Language(s)
English
Published date
09-06-2023
CONTAINED IN VOL. 10.04, 2017 Describes the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation.
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