Name: BS 2011-2.1XA(1981) : 1981 AMD 7553
Brand: BSI

BS 2011-2.1XA(1981) : 1981 AMD 7553

Superseded

View Superseded by

ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS

Superseded date

04-15-1993

Published date

11-23-2012

Publisher

British Standards Institution

Sets down a test procedure whereby specimens to be tested are immersed in a certain solvent at a specified temperature and for a specified time. Covers types of test solvents and conditions, initial measurements, conditioning, recovery, final measurements and information to be given in the relevant specification. BS AMD 7553 RENUMBERS THIS STANDARD TO BS EN 60068-2-45

Committee	GEL/15
DevelopmentNote	Renumbered and superseded by BS EN 60068-2.45. Supersedes 78/27908 DC. (09/2005)
DocumentType	Standard
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 60068-2-45:1993

BS CECC 16000-1:1992	Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays General
BS EN 169000:1993	Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
BS QC 420000:1992	Harmonized system of quality assessment for electronic components. Varistors for use in electronic equipment: generic specification
BS QC 390000:1992	Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Generic specification
BS EN 117000:1997	Harmonized system of quality assessment for electronic components. Generic specification. Solid state all-or-nothing relays. Generic data and methods of test
BS CECC 63000:1990	Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
BS CECC 30800:1991	Harmonized system of quality assessment for electronic components. Sectional specification: tantalum surface mounting capacitors
BS CECC 32200:1989	Harmonized system of quality assessment for electronic components. Sectional specification: fixed chip capacitors with metallized electrodes and polyethylene-terephthalate dielectric for direct current
BS 9400:1970	Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test
BS CECC 00802:1994	Harmonized system of quality assessment for electronic components. Guidance document: CECC Standard method for the specification of surface mounting components (SMDs) of assessed quality
BS QC 410000:1990	Harmonized system of quality assessment for electronic components: potentiometers for use in electronic equipment
BS QC 760000:1990	Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
BS QC 960500:1992	Harmonized system of quality assessment for electronic components. Electromechanical switches for use in electronic equipment. Sectional specification for in-line package switches
BS QC 960000:1992	Harmonized system of quality assessment for electronic components. Electromechanical switches for use in electronic equipment. Generic specification
BS QC 300000:1983	Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Generic specification