BS 5760-18(1997) : 1997 AMD 10390
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
RELIABILITY OF SYSTEMS, EQUIPMENT AND COMPONENTS - REFERENCE CONDITIONS FOR FAILURE RATES OF ELECTRONIC COMPONENTS AND STRESS MODELS FOR CONVERSION
07-15-2000
11-23-2012
Committees responsible
National foreword
Introduction
Guide
1 Scope
2 Normative references
3 Definitions
4 Symbols
5 Reference conditions
6 Generic stress models
7 Specific stress models
Annexes
A (informative) Limitations of reliability models
and predictions
B (informative) Examples
C (informative) Bibliography
Tables
1 Reference conditions for climatic and mechanical
stresses
2 Reference conditions for electrical stresses -
Summary
3 Constants
4 Factor pU for digital CMOs-family ICs
5 Factor pU for bipolar analogue integrated circuits
6 Constants for integrated circuits
7 Constants for transistors
8 Factor pU for transistors
9 Constants for discrete semiconductors
10 Constants for phototransistors
11 Factor pU for phototransistors
12 Constants for LEDs and IREDs
13 Factor pI for LEDs and IREDs
14 Constants for optoelectronic components
15 Constants for capacitors (voltage dependence)
16 Factor pU for capacitors
17 Constants for capacitors (temperature dependence)
18 Factor pT for capacitors
19 Constants for resistors
20 Constants for transformers, inductors and coils
21 Factor pES for low current relays
22 Factor pES for general purpose relays
23 Factor pES for automotive relays
24 Constants for relays
25 Factor pT for relays
26 Factor pES for switches and push-buttons for low
electrical stress
27 Factor pES for switches and push-buttons for
higher electrical stress
28 Factor pU for pilot and signal lamps
Figures
1 Factor pT for IC (without EPROM, OTPROM, EEPROM,
EAROM)
2 Factor pT for EPROM, OTPROM, EEPROM, EAROM
3 Factor pT for transistors, reference and microwave
diodes
4 Factor pT for general-purpose diodes, Schottky
diodes, voltage regulators and Zener diodes, power
semiconductors
5 Factor pT for LEDs, IREDs and optocouplers
6 Factor pT for phototransistors, photodiodes,
photoresistors and photocells
7 Factor pT for resistors
8 Factor pT for transformers, inductors and coils
9 Selection of stress regions in accordance with
current and voltage-operating conditions
10 Factor pS depending on the operating cycles
11 Selection of stress regions in accordance with
current and voltage-operating conditions
A.1 Time dependence of the failure rate
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