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BS CECC14000(1984) : 1984 AMD 7575

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES

Superseded date

02-15-1993

Published date

12-06-2012

Applies to photomultiplier tubes of assessed quality. BS AMD 7575 renumbers this standard to BS EN 114000

Committee
ECL/5
DevelopmentNote
Renumbered and superseded by BS EN 114000. Supersedes 80/29001 DC. (08/2005)
DocumentType
Standard
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
CECC 14000 : 1984 Identical
IEC 60306-4:1971 Similar to

IEC 60462:2010 Nuclear instrumentation - Photomultiplier tubes for scintillation counting - Test procedures
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
CECC 00100 : 1988 BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
IEC 60151-15:1967 Measurements of the electrical properties of electronic tubes and valves. Part 15: Methods of measurement of spurious and unwanted electrode currents
IEC 60306-4:1971 Measurement of photosensitive devices. Part 4: Methods of measurement for photo-multipliers
IEC 60151-1:1963 Measurements of the electrical properties of electronic tubes and valves - Part 1: Measurement of electrode current
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60067:1966 Dimensions of electronic tubes and valves
CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES

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