SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

Amended by

BS EN 60749-32:2003+A1:2010

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2003

Publisher

British Standards Institution

Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications

Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.

Committee	EPL/47
DevelopmentNote	Supersedes BS EN 60749. (09/2005) 2003 Edition Re-Issued in March 2011 & incorporates AMD 1 2010. Supersedes 09/30208094 DC. (03/2011)
DocumentType	Standard
Pages	8
PublisherName	British Standards Institution
Status	Current
Supersedes	BS EN 60749:1999 09/30208094 DC : 0

Standards	Relationship
DIN EN 60749-32:2011-01	Identical
IEC 60749-32:2002+AMD1:2010 CSV	Identical
I.S. EN 60749-32:2003	Identical
UNE-EN 60749-32:2004	Identical
EN 60749-32:2003/A1:2010	Identical
NF EN 60749-32 : 2003 AMD 1 2011	Identical
NBN EN 60749-32 : 2004 AMD 1 2010	Identical
SN EN 60749-32 : 2003	Identical

EN 60695-11-5:2017	Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance
IEC 60695-11-5 : 2.0	FIRE HAZARD TESTING - PART 11-5: TEST FLAMES - NEEDLE-FLAME TEST METHOD - APPARATUS, CONFIRMATORY TEST ARRANGEMENT AND GUIDANCE
IEC 60695-11-5:2016	Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance

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BS EN 60749-32 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

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