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BS EN 61837-2 : 2011

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
Amended by

BS EN 61837-2:2011+A1:2014

Available format(s)

Hardcopy , PDF

Withdrawn date

08-08-2018

Language(s)

English

Published date

01-01-2014

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Configuration of enclosures
4 Designation of types
5 Ceramic enclosure dimensions
6 Lead connections
7 Designation of ceramic enclosures
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Specifies the outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240.

Committee
EPL/48
DevelopmentNote
To be read in conjunction with BS EN 61240. Supersedes 97/230674 DC. (10/2005) Supersedes 09/30200395 DC. (08/2011) 2011 Edition Re-Issued in August 2014 & incorporates AMD 1 2014. Supersedes 13/30278803 DC. (08/2014)
DocumentType
Standard
Pages
92
PublisherName
British Standards Institution
Status
Withdrawn
Supersedes

EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
EN 61019-1 : 2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
EN 60368-2-2:1999 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
EN ISO 1101:2017 Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out (ISO 1101:2017)
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
EN 61240:2017 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60368-2-2:1996 Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
EN 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
EN 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
EN 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
EN 60368-1:2000/A1:2004 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

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