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BS EN 62433-2:2017

Current
Current

The latest, up-to-date edition.

EMC IC modelling Models of integrated circuits for EMI behavioural simulation. Conducted emissions modelling (ICEM-CE)
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

11-14-2017

IEC62433-2:2017 specifies macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE macro-model can also be used for modelling an IC-die, a functional block and an Intellectual Property (IP) block. The ICEM-CE macro-model can be used to model both digital and analogue ICs. This edition includes the following significant technical changes with respect to the previous edition:
Incorporation of an XML based exchange format for model representation.

Committee
EPL/47
DevelopmentNote
Supersedes 07/30163156 DC. (09/2010)
DocumentType
Standard
Pages
112
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN 62433-2:2017 Identical
IEC 62433-2:2017 Identical

IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices
IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework
EN 55017 : 2011 METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011)

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