EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

12-13-2017

Publisher

British Standards Institution

IEC62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.

Committee	EPL/47
DocumentType	Standard
Pages	94
PublisherName	British Standards Institution
Status	Current

Standards	Relationship
EN 62433-3:2017	Identical
IEC 62433-3:2017	Identical

IEC 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TS 61967-3:2014	Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 62433-2:2017	EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EN 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
ISO 8879:1986	Information processing Text and office systems Standard Generalized Markup Language (SGML)
IEC TS 62433-1:2011	EMC IC modelling - Part 1: General modelling framework