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BS IEC 60747-10:1991

Current
Current

The latest, up-to-date edition.

Semiconductor devices Generic specification for discrete devices and integrated circuits
Amendment of

BS 9450:1998

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-31-2011

Publisher

British Standards Institution

1 Scope
2 General
3 Quality assessment procedures
4 Test and measurement procedures
Appendix A - Lot tolerance per cent defective
         (LTPD) sampling plans
Appendix B - Dimensions to be checked
Appendix C - Directions for applied forces for
         mechanical tests
Appendix D - (informative) - Assessment of quality
         levels in ppm (parts per million)
Publication(s) referred to

General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.

This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).

This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.

It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:

  • measurement methods of electrical characteristics;

  • climatic and mechanical tests;

  • endurance tests.

NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.

Committee
EPL/47
DevelopmentNote
Issue Date: 31/07/2011. 1991 Edition incorporates corrigendum to BS QC700000(1991). Renumbers and supersedes BS QC700000(1991). Supersedes 86/24762 DC and BS 9970-0(1985). Together with BS IEC 60748-11, it Supersedes BS 9450(1998). (08/2011)
DocumentType
Standard
Pages
38
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
IEC 60747-10:1991 Identical

BS 5555:1993 Specification for SI units and recommendations for the use of their multiples and of certain other units
BS 3934-3:1992 Mechanical standardization of semiconductor devices Recommendations for the preparation of outline drawings of integrated circuits
BS 6493-1.2:1984 Semiconductor devices. Discrete devices Recommendations for rectifier diodes
BS 3934-1:1992 Mechanical standardization of semiconductor devices Recommendations for the preparation of drawings of semiconductor devices
BS 6100-3.1:1986 Glossary of building and civil engineering terms. Services Energy sources and distribution
BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
BS QC790100(1991) : 1991 AMD 10586 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
BS 6493-2.1:1985 Semiconductor devices. Integrated circuits General
BS 6001-1(1999) : 1999 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - PART 1: SAMPLING SCHEMES INDEXED BY ACCEPTANCE QUALITY LIMIT (AQL) FOR LOT-BY-LOT INSPECTION
BS 7151(1989) : AMD 7825 SPECIFICATION FOR REPRESENTATION OF DATES AND TIMES IN INFORMATION INTERCHANGE
BS 6493-3:1985 Semiconductor devices Mechanical and climatic test methods
BS 6493-2.2(1986) : 1986 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
BS 6493-1.3:1986 Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes
BS 3934-2(1992) : 1992 AMD 13374 MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS
BS 6493-2.3:1987 Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits

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