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BS IEC 60747-14.1 : 2010

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - PART 14-1: SEMICONDUCTOR SENSORS - GENERIC SPECIFICATION FOR SENSORS
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2010

Publisher

British Standards Institution

FOREWORD
1 Scope
2 Normative references
3 Terminology, units, letter symbols, terms and
  definitions
4 Standard environmental conditions
5 Marking
6 Quality assessment procedures
7 Test and measurement procedures
Annex A (normative) - Sampling procedures
Bibliography

Provides general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors.

Committee
EPL/47
DevelopmentNote
Supersedes 98/232612 DC. (05/2005) Supersedes 08/30181401 DC. (05/2010)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
IEC 60747-14-1:2010 Identical

IEC 61193-2:2007 Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
IECQ 001002-3:2005 IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60721-2-1:2013 Classification of environmental conditions - Part 2-1: Environmental conditions appearing in nature - Temperature and humidity
IEC 62047-1:2016 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
IEC 60721-3-0:1984+AMD1:1987 CSV Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Introduction
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60721-3-1:1997 Classification of environmental conditions - Part 3 Classification of groups of environmental parameters and their severities - Section 1: Storage

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PDF - English
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