Customer Support: +1 416-401-8730

Login to i2i Subscription Intertek.com
  • There are no items in your cart
Please enter a keyword to search
Advanced search

BS IEC 62860:2013

Current
Current

The latest, up-to-date edition.

Test methods for the characterization of organic transistors and materials
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-31-2014

Publisher

British Standards Institution

1. Overview
2. Definitions, acronyms, and abbreviations
3. Standard OFET characterization procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants

Specifies a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Committee
NTI/1
DocumentType
Standard
Pages
28
PublisherName
British Standards Institution
Status
Current

Standards Relationship
IEC 62860:2013 Identical

View more information
US$237.18
Excluding Tax where applicable
USD
CAD
CHF
CNY
DKK
EUR
GBP
HKD
IDR
INR
JPY
KRW
MXN
NOK
NZD
SEK
SGD
USD
ZAR
Hardcopy - English
PDF - English
01
02
03
04
05
06
07
08
09
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

or

Get in touch with us