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BS ISO 11938:2012

Current
Current

The latest, up-to-date edition.

Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

04-30-2013

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Procedure of mapping analysis
5 Methods for displaying element maps
6 Evaluation of uncertainty
7 Report
Annex A (normative) - Comparison of absorption
        effects for a light element
Bibliography

Gives procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry.

This International Standard provides procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method, the calibration method, the correlation method and the matrix correction method.

Committee
CII/9
DevelopmentNote
Supersedes 10/30185165 DC. (04/2013)
DocumentType
Standard
Pages
22
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
ISO 11938:2012 Identical

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 5725-6:1994 Accuracy (trueness and precision) of measurement methods and results — Part 6: Use in practice of accuracy values
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 22489:2016 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 16592:2012 Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
ISO 14594:2014 Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 17470:2014 Microbeam analysis Electron probe microanalysis Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

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