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BS ISO 22309:2011

Current
Current

The latest, up-to-date edition.

Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

10-31-2011

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Specimen preparation
5 Preliminary precautions
6 Analysis procedure
7 Data reduction
Annex A (informative) - The assignment of spectral peaks
        to their elements
Annex B (informative) - Peak identity/interferences
Annex C (informative) - Factors affecting the uncertainty
        of a result
Annex D (informative) - Analysis of elements with atomic
        number < 11
Annex E (informative) - Example data from a reproducibility
        study within a laboratory and between laboratories
Bibliography

Provides guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA); any expression of amount, i.e. in terms of percent (mass fraction), as large/small or major/minor amounts is deemed to be quantitative.

This International Standard gives guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA); any expression of amount, i.e. in terms of percent (mass fraction), as large/small or major/minor amounts is deemed to be quantitative. The correct identification of all elements present in the specimen is a necessary part of quantitative analysis and is therefore considered in this International Standard. This International Standard provides guidance on the various approaches and is applicable to routine quantitative analysis of mass fractions down to 1%, utilizing either reference materials or “standardless?? procedures. It can be used with confidence for elements with atomic number Z

Committee
CII/9
DevelopmentNote
Supersedes 04/30122733 DC (05/2006) Reviewed & Confirmed by BSI, July 2017. (06/2017)
DocumentType
Standard
Pages
34
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
ISO 22309:2011 Identical

ISO 16700:2016 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO Guide 33:2015 Reference materials Good practice in using reference materials
EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)
ISO 14594:2014 Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 14595:2014 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 15632:2012 Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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PDF - English
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