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BS ISO 24173:2009

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

Available format(s)

Hardcopy , PDF

Superseded date

02-19-2024

Language(s)

English

Published date

10-31-2009

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment for EBSD
5 Operating conditions
6 Calibrations required for indexing of EBSPs
7 Analytical procedure
8 Measurement uncertainty
9 Reporting the results
Annex A (informative) - Principle of EBSD
Annex B (normative) - Specimen preparation for EBSD
Annex C (informative) - Brief introduction to crystallography
        and EBSP indexing, and other information useful for
        EBSD
Bibliography

Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD).

This International Standard gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Committee
CII/9
DevelopmentNote
Supersedes 08/30133935 DC. (11/2009)
DocumentType
Standard
Pages
54
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
ISO 24173:2009 Identical

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
SAC GB/T 19501 : 2013 MICROBEAM ANALYSIS - GENERAL GUIDE FOR ELECTRON BACKSCATTER DIFFRACTION ANALYSIS
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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US$330.61
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