• There are no items in your cart

BS ISO 25498:2010

Current
Current

The latest, up-to-date edition.

Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

06-30-2010

Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Reference materials
6 Equipment
7 Specimens
8 Experimental procedure
9 Measurement and solution of the SAED patterns
10 180 Degrees ambiguity
11 Uncertainty estimation
Annex A (informative) - Interplanar spacing
Annex B (informative) - Spot diffraction patterns
        of single crystals for BCC, FCC and HCP
        structure
Bibliography

Defines the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to test areas of micrometres and sub-micrometres in size.

Committee
CII/9
DevelopmentNote
Supersedes 17/30343628 DC. (03/2018)
DocumentType
Standard
Pages
40
PublisherName
British Standards Institution
Status
Current
SupersededBy
Supersedes

Standards Relationship
ISO 25498:2010 Identical
ISO 25498:2018 Identical

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 15932:2013 Microbeam analysis — Analytical electron microscopy — Vocabulary

View more information

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.