PD ISO/TR 10064-5:2005

Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Instrument environment
   4.1 Environment
        4.1.1 Important parameters
        4.1.2 Practical guidelines
        4.1.3 Workshop environment
   4.2 Effect of temperature on gears and artifacts
        4.2.1 Profile temperature effect calculation
        4.2.2 Helix temperature effect calculation
        4.2.3 Tooth thickness temperature effect calculation
5 Measurement system condition
   5.1 Evaluation procedure for generative instruments
        5.1.1 Verification of mounting centres
        5.1.2 Axial measuring slide verification
   5.2 Evaluation procedures for CMM type measuring
        instruments
        5.2.1 Performance test according to ISO 10360
        5.2.2 Ball plate test
        5.2.3 Rotary tables
   5.3 Probe system
        5.3.1 Stylus
        5.3.2 Data recording system
   5.4 Filtering
        5.4.1 Mechanical filtering
        5.4.2 Electrical filtering
        5.4.3 Mathematical filtering
   5.5 Uncertainty estimation
6 Artifacts
   6.1 Mounting reference features
   6.2 Suggested master artifacts
        6.2.1 Integral base circle involute master
        6.2.2 Helix artifact
        6.2.3 Pitch variation, total cumulative pitch
               variation and runout artifact
        6.2.4 Tooth thickness artifacts
        6.2.5 Workpiece-like artifacts
   6.3 Modified base circle involute artifact testing
   6.4 Non-involute - Pin (cylindrical), plane (flank)
        and ball (spherical) artifacts
        6.4.1 Types of non-involute artifacts
        6.4.2 Non-involute artifact function
        6.4.3 Plane artifact calibration
        6.4.4 Pin or ball artifact calibration
        6.4.5 Probe-tip effects when calculating reference
               curve
        6.4.6 Measurement location
        6.4.7 Non-involute master interpretation
   6.5 Helix artifact testing
        6.5.1 Modified-lead helix artifact testing
        6.5.2 Non-involute helix masters
   6.6 Modified eccentricity pitch artifact testing
7 Uncertainty estimation guidelines
   7.1 Uncertainty estimation methods
        7.1.1 General methods
        7.1.2 Comparator methods
   7.2 Calculation of U[95] measurement uncertainty
   7.3 Measurement parameters
        7.3.1 Line-fit parameters
        7.3.2 Band-fit parameters
        7.3.3 Pitch parameters
8 Measurement procedures
   8.1 Traceability
   8.2 Operating conditions
        8.2.1 Conditions for bias determination
        8.2.2 Conditions for standard uncertainty estimation
        8.2.3 Conditions for combined determinations
   8.3 Measurements
   8.4 Calibration procedure
        8.4.1 Initial set-up and adjustments
        8.4.2 Initial calibration procedure
        8.4.3 Ongoing calibration procedure
        8.4.4 Tooling and gauges
9 Comparator measurement uncertainty estimation guidelines
   9.1 Direct comparator example A
   9.2 Comparator approach, expanded for workpiece
        characteristic influence
        9.2.1 Comparator example B
        9.2.2 Comparator example C
   9.3 Comparator approach, expanded for workpiece
        characteristic and geometry similarity influences
10 Statistical process control
   10.1 Definitions
   10.2 Constructing the X and MR chart
   10.3 Criteria for evidence of lack of control
   10.4 When control chart data fails one or more criteria
        according to 10.3
11 Instrument fitness for use
   11.1 Limiting measurement uncertainty
        11.1.1 GPS Tolerance reduction method
        11.1.2 Tolerance ratio method
        11.1.3 Instrument uncertainty guidelines
   11.2 Measurement uncertainty sources
   11.3 Reducing measurement uncertainty
        11.3.1 Following a different calibration procedure
        11.3.2 Reducing uncertainty of the reference master
               certification
        11.3.3 Improving the measuring process
12 Measurement process (instrument) correlation
   12.1 Basis for comparison
   12.2 Correlation of measurement
Annex A (informative) Effect of temperature on gears and
        artifacts
Annex B (informative) Modified involute, helix, pitch
        artifact testing
Annex C (informative) Non-involute pin, ball, or plane
        (flank) artifact interpretation
Bibliography