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CEI EN 60512-6-3 : 2003

Current
Current

The latest, up-to-date edition.

CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENT - PART 6-3: DYNAMIC STRESS TESTS TEST 6C: SHOCK
Available format(s)

Hardcopy , PDF

Language(s)

English - Italian

Published date

01-01-2003

FOREWORD
1. GENERAL
2. PREPARATION OF THE SPECIMEN
3. TEST METHOD
4. MEASUREMENTS
5. DETAILS TO BE SPECIFIED
ANNEX ZA - NORMATIVE REFERENCES
           TO INTERNATIONAL PUBLICATIONS
           WITH THEIR CORRESPONDING
           EUROPEAN PUBLICATIONS

Describes the detail specification, is used for testing electromechanical components within the scope of IEC technical committee 48.

Committee
CT 48
DevelopmentNote
Classificazione CEI 48-97 (07/2003)
DocumentType
Standard
Pages
12
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 60512-6-3:2002 Identical
EN 60512-6-3:2002 Identical

IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60512-7:1993 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
IEC 60512-2-5:2003 Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance
EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60512-1-1:2002 Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
IEC 60512-2-1:2002 Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method
EN 60512-1-1:2002 Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination
EN 60512-2-1:2002 Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method

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